Abstract: The angular sensitivity of neutron-induced single-event upsets (SEUs) is studied in 12-nm FinFET SRAMs. Irradiation experiments are performed using a terrestrial environment-compatible ...
This concept isn’t new—in fact, it is the essence of representational state transfer (REST). Instead of converting to a ...
Abstract: Fifth generation (5G) mobile communication systems have entered the stage of commercial deployment, providing users with new services, improved user experiences as well as a host of novel ...
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